Channel Hot Carriers
Reliability and Radiation Effects on Advanced CMOS Technologies

 

 

[TUTORIAL UNDER CONSTRUCTION]

Channel Hot Carriers may be a serious concern, since they heavily alter the characteristics of MOSFETs.

When the lateral field of MOSFET is significantly high, carriers coming from the channel can be heated in the pinch-off energy and acquire enough momentum to be injected in the gate oxide. This may lead to changes in the threshold voltage and mobility decrease.

 

 

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