People
Reliability and Radiation Effects on Advanced CMOS Technologies

 

 
  Alessandro Paccagnella  

Alessandro Paccagnella

Full Professor

alessandro.paccagnella@dei.unipd.it

Alessandro Paccagnella is Full Professor of Electronics and former Director of the Department of Information Engineering at the University of Padova. He is the author of more than 300 scientific papers, and about 200 of them have been published on international journals. In the past, his research has been directed to the study of different aspects of physics, technology, and reliability of semiconductor devices. At present, he coordinates the activity of a research group focused on the study of ultra-thin gate dielectrics in MOS devices and on Total Ionizing Dose and Single Event Effects induced by ionizing radiation on integrated circuits.

 
  Simone Gerardin  

Simone Gerardin

Associate Professor

simone.gerardin@dei.unipd.it

Simone Gerardin received the Laurea degree (cum laude) in Electronics Engineering in 2003, and a Ph.D. in Electronics and Telecommunications Engineering in 2007, both from the University of Padova - Italy. He is currently an associate professor at the same university. His research is focused on soft and hard errors induced by ionizing radiation in advanced CMOS technologies, and on their interplay with device aging and ESD. Simone has authored or co-authored about 100 papers published in international journals, more than 100 conference presentations, three book chapters, four tutorials at international conferences and co-edited one book. He is currently an associate editor for the IEEE Transactions on Nuclear Science and reviewer for several scientific journals.

 
  Marta Bagatin  

Marta Bagatin

Research Assistant

marta.bagatin@dei.unipd.it

Marta Bagatin received the Laurea degree (cum laude) in Electronic Engineering from the University of Padova in 2006 and a Ph.D. in Information Engineering from the same University in 2010. Her research interests concern radiation and reliability effects on electronic devices, especially on volatile and non-volatile semiconductor memories. The results of her work were recognized with the Outstanding Student Paper Award at NSREC 2008 and NSREC 2009, the Best Student Presentation Award at RADECS 2008, and the NPSS Phelps Award 2009.